>From Intel:
Soft errors are temporary; a bit of data is lost, but
the memory cell still functions correctly and rewriting
the data in the cell corrects the error. Soft errors
are intermittent errors that occur as a result of the
passage of ionizing radiation through the memory cells
of semiconductor devices. The most common source of this
radiation is alpha particles generated as a result of
the decay of thorium and uranium, which are found in
trace amounts in the packaging materials of all plastic
and ceramic encapsulated devices [3,4].
>So I assume that the plastic cover on the RAM chips is
>protection enough, right?
>
>Andreas
Not when they are the source :)
Rob
(rriggs@tesser.com)