Re: [PATCH v1 1/1] lib/test_scanf: Handle n_bits == 0 in random tests

[Richard Fitzgerald]

On 27/07/2021 16:01, Andy Shevchenko wrote:
> UBSAN reported (via LKP)
>
> [   11.021349][    T1] UBSAN: shift-out-of-bounds in lib/test_scanf.c:275:51
> [   11.022782][    T1] shift exponent 32 is too large for 32-bit type 'unsigned int'
>
> When n_bits == 0, the shift is out of range. Switch code to use GENMASK
> to handle this case.
>
> Fixes: 50f530e176ea ("lib: test_scanf: Add tests for sscanf number conversion")
> Reported-by: kernel test robot <oliver.sang@xxxxxxxxx>
> Signed-off-by: Andy Shevchenko <andriy.shevchenko@xxxxxxxxxxxxxxx>
> ---

Reviewed-by: Richard Fitzgerald <rf@xxxxxxxxxxxxxxxxxxxxx>

Sorry about that. Would have been sensible to use GENMASK anyway.