Re: [] Diagnosing an IDE lockup with SMART long tests

From: Raphael Manfredi
Date: Wed Sep 02 2009 - 08:00:05 EST

Quoting Ondrej Zary:
: On Wednesday 02 September 2009, Raphael Manfredi wrote:
: > Quoting Robert Hancock:
: > > It's most likely a bug in the IDE code somewhere, but realistically the
: > > most effective course of action would likely be to switch from the old
: > > IDE drivers and use libata instead. The IDE code doesn't receive that
: > > much testing these days, and it's really hard to debug (as you've seen,
: > > the debugging output is rather atrocious).
: >
: > I gave it a shot anyway. Converting to PATA was surprisingly
: > straighforward.
: >
: > Anyway, I now get the following when running SMART long tests on /dev/sda:
: >
: > ata1: lost interrupt (Status 0x50)
: >
: > And the machine hangs... So I'm back to square one.
: > How do I prevent lockups on the system when running SMART long tests?
: What drive is that? Isn't that an IBM drive with buggy firmware?

Ah, you're right. It's not an IBM, it's an Hitashi, bought shortly
after IBM sold out their disk activity.

Here's hdparm -i with extra spaces removed:

Model=HDS722512VLAT80, FwRev=V33OA60A, SerialNo= VN343EC4C6JM8M

Is this a buggy firmware revision?

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