[2.6.15] PDC202XX error: "no DRQ after issuing MULTWRITE_EXT"
From: Kyle Moffett
Date: Sun Mar 12 2006 - 01:28:55 EST
I upgraded my kernel from a Debian linux-image-2.6.12-1-powerpc
kernel (with a patch to the powermac IDE driver to prevent
deactivating empty interfaces) to a Debian linux-image-2.6.15-powerpc
kernel and started getting the following message in the logs. It
refers to a Samsung PATA drive attached to the secondary channel on a
Sonnet Tempo ATA/100. The card is a rebranded FirmTek UltraTek/100
which is actually a PDC20268 with a Mac-bootable firmware ROM.
hda: status timeout: status=0xd0 { Busy }
PDC202XX: Secondary channel reset.
hdi: no DRQ after issuing MULTWRITE_EXT
ide4: reset: success
The message seems to occur randomly, and does not coincide with the
routine SMART testing of the drive (triggered by smartd) or the
routing SMART status monitoring run from a custom Perl curses
application. The output of "smartctl -a /dev/hdi" is attached. You
will notice that all diagnostics appear to be perfectly OK, and
repeated checks of the RAID for internal consistency all indicate
correctness, so it's not an urgent data-corruption issue, but I
believe it merits further investigation.
Thanks for your time!
Cheers,
Kyle Moffett
smartctl version 5.34 [powerpc-unknown-linux-gnu] Copyright (C)
2002-5 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SP0822N
Serial Number: S06QJ10Y946116
Firmware Version: WA100-32
User Capacity: 80,060,424,192 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 1
Local Time is: Sun Mar 12 00:56:28 2006 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== STARRT OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data
Collection: Enabled.
Self-test execution status: ( 0) The previous self-test
routine completed
without error or no self-
test has ever
been run.
Total time to complete Offline
data collection: (1980) seconds
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection
on/off suppport.
Suspend Offline collection
upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test
supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging
support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 33) minutes.
SMART Attributes Data Structure revision number: 17
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 099 051 Pre-fail
Always - 0
3 Spin_Up_Time 0x0007 252 252 011 Pre-fail
Always - 0
4 Start_Stop_Count 0x0032 252 252 000 Old_age
Always - 0
5 Reallocated_Sector_Ct 0x0033 252 252 011 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 252 252 051 Pre-fail
Always - 0
8 Seek_Time_Performance 0x0025 092 092 015 Pre-fail
Offline - 3730
9 Power_On_Half_Minutes 0x0032 099 099 000 Old_age
Always - 29h+25m
10 Spin_Retry_Count 0x0033 252 252 051 Pre-fail
Always - 0
11 Calibration_Retry_Count 0x0012 252 252 000 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 252 252 000 Old_age
Always - 0
190 Unknown_Attribute 0x0022 142 133 000 Old_age
Always - 37
194 Temperature_Celsius 0x0022 145 133 000 Old_age
Always - 36
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age
Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age
Always - 0
197 Current_Pending_Sector 0x0012 252 252 000 Old_age
Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 199 199 000 Old_age
Always - 173
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age
Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age
Always - 0
Warning! SMART ATA Error Log Structure error: invalid SMART checksum.
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision
number = 1
Num Test_Description Status Remaining LifeTime
(hours) LBA_of_first_error
# 1 Short offline Completed without error 00%
3511 -
# 2 Short offline Completed without error 00%
3487 -
# 3 Short offline Completed without error 00%
3463 -
# 4 Short offline Completed without error 00%
3439 -
# 5 Short offline Completed without error 00%
3415 -
# 6 Short offline Completed without error 00%
3391 -
# 7 Extended offline Completed without error 00%
3367 -
# 8 Short offline Completed without error 00%
3343 -
# 9 Short offline Completed without error 00%
3319 -
#10 Short offline Completed without error 00%
3295 -
#11 Short offline Completed without error 00%
3271 -
#12 Short offline Completed without error 00%
3247 -
#13 Short offline Completed without error 00%
3223 -
#14 Extended offline Completed without error 00%
3200 -
#15 Short offline Completed without error 00%
3175 -
#16 Short offline Completed without error 00%
3151 -
#17 Short offline Completed without error 00%
3127 -
#18 Short offline Completed without error 00%
3103 -
#19 Short offline Completed without error 00%
3080 -
#20 Short offline Completed without error 00%
3056 -
#21 Extended offline Completed without error 00%
3032 -
SMART Selective Self-Test Log Data Structure Revision Number (0)
should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data
structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TESET_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 281479271677952 0 Not_testing
4 0 281479271767952 Not_testing
5 604800 4 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute
delay.
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